Characterization Equipment
The G2N Centre has a wide variety of thin film, device and circuit characterization tools.
- Dektak 8 Stylus Profilometer
- Dimension 3100 Scanning Probe Microscope
- Hitachi S-3000N Scanning Electron Microscope
- Keithley 4200-SCS Semiconductor Characterization System
- FT-IR 8400S Spectrometer
- UV-2501PC Spectrometer
- Raman Spectrometer
- Reichert Polylite 88 Microscope
- Stressgauge
- Wyko Optical Profiler
